Selective surface modifications with a scanning tunneling microscope

Applied Physics Letters

Volumn 70, Issue 14, 1997, Pages 1846-1848

  Konsek, S L ^a   Coope, R J N ^a,b   Pearsall, T P ^a   Tiedje, T ^a,b,c  

^a UNIVERSITY OF WASHINGTON   (United States)

^b UNIVERSITY OF BRITISH COLUMBIA   (Canada)

^c Department of Electrical Engineering ^*

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001703709     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.118709     Document Type: Article

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