Quantized Adhesion Detected with the Atomic Force Microscope

Journal of the American Chemical Society

Volumn 114, Issue 12, 1992, Pages 4917-4918

  Hoh, Jan H ^a,b   Cleveland, Jason P ^a,b   Prater, Craig B ^a,b   Revel, Jean Paul ^a,b   Hansma, Paul K ^a,b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001691934     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja00038a075     Document Type: Article

References (18)

1. Binning, G.; Quate, C. F.; Gerber, C. Phys. Rev. Lett. 1986, 56, 930-933.
2. Burnham, N. A.; Colton, R. J. J. Vac. Sci. Technol. 1989, A7, 2096-2913.
3. Landman, U.; Luedtke, W. D.; Burnham, N. A.; Colton, R. J. Science 1990, 248, 454-461.
4. Ducker, W. A.; Senden, T. J.; Pashley, R. M. Nature 1991, 353, 239-241.
5. Butt, H. J. Biophys. J. 1991, 60, 777-785.
6. Weisenhorn, A. L.; Hansma, P. K.; Albrecht, T. R.; Quate, C. F. Appl. Phys. Lett. 1989, 54, 2651-2653.
7. Weisenhorn, A. L.; Maivald, P.; Butt, H.-J.; Hansma, P. K. Phys. Rev. Lett. B, in press.
8. Israelachvili, J. N. Proc. Natl. Acad. Sci. U.S.A. 1987, 84, 4722-4724.
9. Israelachvili, J. N. Intermolecular and Surface Forces, 2nd ed.; Academic Press: New York, 1992.
10. Israelachvili, J. N.; Pashley, R. M. Nature 1983, 306, 249-250.
11. Israelachvili, J. N.; McGuiggan, P. M. Science 1988, 241, 795-800.
12. Israelachvili, J. N. Acc. Chem. Res. 1987, 20, 415-421.
13. Israelachvili, J. N.; Pashley, R. Nature 1982, 300, 341-342.
14. Albrecht, T. R.; Akamine, S.; Carver, T. E.; Quate, C. F. J. Vac. Sci. Technol. A 1990, 8, 3386-3396.
15. Hoh, J. H.; Lai, R.; John, S. A.; Revel, J. P.; Arnsdorf, M. F. Science 1991, 253, 1405-1408.
16. Iler, R. K. The Chemistry of Silica; Wiley and Sons: New York, 1979.
17. Bousse, L.; Mostarshed, S. J. Electroanal. Chem. 1991, 302, 269-274.
18. Granick, S. Science 1991, 253, 1374-1379.