Atomic-force microscope observation and molecular-scale flattening of the single-crystal surface of 4-dimethylamino-N-methyl-4-stilbazolium tosylate (DAST)

Optics Letters

Volumn 25, Issue 15, 2000, Pages 1107-1109

  Nanjo, H ^a   Qian, P ^b   Sanada, N ^a   Suzuki, T M ^a   Takahashi, H ^c   Ito, H ^c   Komatsu, K ^c  

^a TOHOKU NATL INDUST RES INSTITUTE   (Japan)

^b Intelligent Cosmos Research Institute   (Japan)

^c TOHOKU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR-SCALE FLATNESS;

ATOMIC FORCE MICROSCOPY; LIGHT SCATTERING; LIGHT TRANSMISSION; MOLECULAR ORIENTATION; SINGLE CRYSTALS; SURFACE ROUGHNESS;

ELECTROOPTICAL EFFECTS;

EID: 0001670848     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.25.001107     Document Type: Article

References (19)

1. A. Yokoo, S. Tomaru, I. Yokohama, H. Kobayashi, H. Itoh, and T. Kaino, Nonlinear Opt. 15, 275 (1996).
2. M. S. Litz, D. C. Judy, G. A. Huttlin, C. Lazard, L. F. Libelo, X.-C. Zhang, and Z. Lu, Proc. SPIE 3158, 72 (1997).
3. S. Tomaru, S. Matsumoto, T. Kurihara, H. Suzuki, N. Ooba, and T. Kaino, Appl. Phys. Lett. 58, 2583 (1991).
4. D. F. Eaton, Science 253, 281 (1991).
5. H. Minemoto, Y. Ozaki, N. Sonoda, and T. Sasaki, Appl. Phys. Lett. 63, 3565 (1993).
6. H. Nakayama, R. Matsushima, N. Okamoto, A. Mizuno, O. Sugihara, and C. Egami, Appl. Phys. Lett. 69, 2813 (1996).
7. H. Nakanishi, H. Matsuda, S. Okada, and M. Kato, Proc. Mater. Res. Soc. 1, 97 (1989).
8. Q. Wu and X.-C. Zhang, Appl. Phys. Lett. 67, 3523 (1995).
9. F. Pan, G. Knöpfle, Ch. Bosshard, S. Follonier, R. Spreiter, M. S. Wang, and P. Gunter, Appl. Phys. Lett. 69, 13 (1996).
10. R. Spreiter, Ch. Bosshard, F. Pan, and P. Günter, Opt. Lett. 22, 564 (1997).
11. G. Knöpfle, R. Schlesser, R. Ducret, and P. Günter, Nonlinear Opt. 9, 143 (1995).
12. T. Sasaki, Polyfile 33, 35 (1996).
13. B. A. Fuchs, C. K. Syn, and S. P. Velsko, Appl. Opt. 28, 4465 (1989).
14. H. Kagawa, M. Sagawa, A. Kakuta, M. Kaji, M. Saeki, and Y. Namba, Appl. Opt. 34, 3421 (1995).
15. P. E. Burrows, S. R. Forrest, L. S. Sapochak, J. Schwartz, P. Fenter, T. Buma, V. S. Ban, and J. L. Forrest, J. Cryst. Growth 156, 91 (1995).
16. S. R. Forrest, P. E. Burrows, A. Stroustrup, D. Strickland, and V. S. Ban, Appl. Phys. Lett. 68, 1326 (1996).
17. A. Borghesi, A. Sassella, R. Tubino, S. Destri, and W. Porzio, Adv. Mater. 10, 931 (1998).
18. S. Sohma, H. Takahashi, T. Taniuchi, and H. Ito, Chem. Phys. 245, 359 (1999).
19. F. Pan, M. S. Wong, Ch. Bosshard, and P. Günter, Adv. Mater. 8, 592 (1996).