Growth, structure and electrical properties of epitaxial thulium suicide thin films on silicon

Journal of Applied Physics

Volumn 81, Issue 3, 1997, Pages 1217-1221

  Travlos, A ^a   Salamouras, N ^a   Boukos, N ^a  

^a INSTITUTE OF MATERIALS SCIENCE   (Greece)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001664638     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363865     Document Type: Article

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