Simultaneous determination of the strain/stress tensor and the unstrained lattice constants by x-ray diffraction

Applied Physics Letters

Volumn 69, Issue 17, 1996, Pages 2495-2497

  Wieder, Thomas ^a  

^a DARMSTADT UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001663832     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117717     Document Type: Article

References (19)

1. V. Hauk and E. Macherauch, Adv. X-Ray Anal. 27, 81 (1984).
2. I. C. Noyan and J. B. Cohen, Residual Stress (Springer, Berlin, 1987).
3. V. Hauk and Härtereitech. Mitt. 50, 138 (1995).
4. B. Eigenmann and E. Macherauch, Materialwiss. Werkstofftech. 26, 148 (1995).
5. 0,m are not mentioned further on.
6. I. I. C. Noyan, Adv. X-Ray Anal. 28, 281 (1985).
7. V. Hauk, Härtereitech. Mitt. 46, 52 (1991).
8. T. Wieder, Thin Solid Films 256, 39 (1995).
9. T. Wieder, J. Appl. Phys. 78, 838 (1995).
10. G. E. Dieter, Mechanical Metallurgy (McGraw-Hill, London, 1988).
11. 0 → a will fake a strain of 0.01 which is in the order of elastic strains.
12. i3 = 0.
13. T. Wieder, Comput. Phys. Commun. 85, 398 (1995).
14. The minimization has been included into the computer program SBGBBG; a previous version is described in Ref. 13.
15. 3. Variation of the data with respect to ℓ is gained by using as much as possible different (hkl) reflections.
16. I. N. Bronstein and K. A. Semendjajew, Taschenbuch der Mathematik (Harri Deutsch, Frankfurt, 1980).
17. J. Zendehroud, T. Wieder, and H. Klein, Materialwiss. Werkstofftech. 26, 553 (1995).
18. K. Van Acker, L. De Buyser, J. P. Celis, and P. Van Houtte, J. Appl. Crystallogr. 27, 56 (1994).
19. Landolt-Börnstein (Springer, Berlin, 1971), Vol. II.1.1.