Highly simplified device for ultrashort-pulse measurement

Optics Letters

Volumn 26, Issue 12, 2001, Pages 932-934

  O'Shea, Patrick ^a   Kimmel, Mark ^a   Gu, Xun ^a   Trebino, Rick ^a  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

FRESNEL BIPRISMS;

CRYSTALS; FREQUENCIES; NONLINEAR OPTICS; PARAMETER ESTIMATION; SPECTROMETERS; ULTRASHORT PULSES;

OPTICAL DEVICES;

EID: 0001663454     PISSN: 01469592     EISSN: None     Source Type: Journal    
DOI: 10.1364/OL.26.000932     Document Type: Article

References (5)

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2. R. Trebino, K. W. DeLong, D. N. Fittinghoff, J. N. Sweetser, M. A. Krumbügel, and D. J. Kane, Rev. Sci. Instrum. 68, 3277 (1997).
3. E. Hecht, in Optics, 3rd ed. (Addison-Wesley, Reading, Mass., 1998), p. 391.
4. C. Radzewicz, P. Wasylczyk, and J. S. Krasinski, Opt. Commun. 186, 329 (2000).
5. A. C. Tien, S. Kane, J. Squier, B. Kohler, and K. Wilson, J. Opt. Soc. Am. B 13, 1160 (1996).