Recombination activity of iron-related complexes in silicon studied by temperature dependent carrier lifetime measurements

Applied Physics Letters

Volumn 67, Issue , 1995, Pages 3930-

  Kaniava, A ^a   Rotondaro, A L P ^a   Vanhellemont, J ^a   Menczigar, U ^b   Gaubas, E ^c  

^a IMEC   (Belgium)

^b IHP   (Germany)

^c VILNIUS UNIVERSITY   (Lithuania)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001653856     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.114408     Document Type: Article

References (13)