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Applied Physics Letters

Volumn 52, Issue 18, 1988, Pages 1514-1516

Effect of bias on the response of metal-oxide-semiconductor devices to low-energy x-ray and cobalt-60 irradiation

(4) Fleetwood, D M a Winokur, P S a Dozier, C M b Brown, D B b

a SANDIA NATIONAL LABORATORIES (United States)

b NAVAL RESEARCH LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001649726 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.99116 Document Type: Article

Times cited : (29)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.