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Volumn 76, Issue 19, 1996, Pages 3574-3577
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Measurement of 0.35 μm laser imprint in a thin si foil using an x-ray laser backlighter
a b,c a a d a a a |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001640225
PISSN: 00319007
EISSN: 10797114
Source Type: Journal
DOI: 10.1103/PhysRevLett.76.3574 Document Type: Article |
Times cited : (78)
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References (20)
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