메뉴 건너뛰기




Volumn 76, Issue 19, 1996, Pages 3574-3577

Measurement of 0.35 μm laser imprint in a thin si foil using an x-ray laser backlighter

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001640225     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.76.3574     Document Type: Article
Times cited : (78)

References (20)
  • 3
  • 8
  • 11
    • 5244364677 scopus 로고
    • T. W. Barbee, Jr., et al.,Appl. Opt., 32, 4825, (1993). APOPAI.
    • (1993) Appl. Opt. , vol.32 , pp. 4825
    • Barbee, T.W.1
  • 13
    • 0029545874 scopus 로고
    • SPIE–International Society for Optical Engineering, Bellingham, WA
    • M. H. Key, et.al., in XUV Lasers and Applications, SPIE Proceedings Vol. 2520 (SPIE–International Society for Optical Engineering, Bellingham, WA, 1995), p.279.
    • (1995) XUV Lasers and Applications, SPIE Proceedings , vol.2520 , pp. 279
    • Key, M.H.1
  • 17
    • 11944252311 scopus 로고
    • 360, 221, (1990):322, L45
    • C. A. Iglesias, et.al., Astrophys. J, 397, 717, (1992):360, 221, (1990):322, L45, (1987).
    • (1992) Astrophys. J , vol.397 , pp. 717
    • Iglesias, C.A.1
  • 19
    • 85035209199 scopus 로고    scopus 로고
    • private communication
    • S. N. Dixit (private communication).
    • Dixit, S.N.1
  • 20
    • 85035200586 scopus 로고    scopus 로고
    • Report No. UCRL-JC-123082, to be published
    • S. G. Glendinning, et.al., Report No. UCRL-JC-123082, 1996 (to be published).
    • (1996)
    • Glendinning, S.G.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.