ECE imaging of electron temperature and electron temperature fluctuations (invited)

Review of Scientific Instruments

Volumn 72, Issue 1 II, 2001, Pages 301-306

  Deng, B H ^a   Domier, C W ^a   Luhmann Jr , N C ^a   Brower, D L ^b   Cima, G ^c   Donne A J H ^d   Oyevaar, T ^d   Van De Pol, M J ^d  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^d FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001624365     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1319864     Document Type: Article

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