Spectroscopic and photorefractive characterization of cadmium telluride crystals codoped with vanadium and manganese

Physical Review B - Condensed Matter and Materials Physics

Volumn 55, Issue 23, 1997, Pages 15378-15381

  Schwartz, Robert N ^a   Wang, Chen Chia ^b  

^a Hughes Aircraft Co   (United States)

^b NEC LABORATORIES AMERICA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001622690     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.15378     Document Type: Article

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