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Applied Physics Letters

Volumn 54, Issue 11, 1989, Pages 1060-1062

Nonaqueous chemical depth profiling of YBa2Cu3O 7-x

(3) Vasquez, R P a Foote, M C a Hunt, B D a

a CALIFORNIA INSTITUTE OF TECHNOLOGY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001600328 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.101425 Document Type: Article

Times cited : (33)

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