A New Synchrotron-Based Diffraction Technique for Perturbation Crystallography

Journal of Applied Crystallography

Volumn 31, Issue 3, 1998, Pages 414-422

  Graafsma, H ^a   Heunen, G W J C ^a   Schulze, C ^b  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b PAUL SCHERRER INSTITUTE   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001596925     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889897014933     Document Type: Article

References (22)

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