Rotating analyzer-fixed analyzer ellipsometer based on null type ellipsometer

Review of Scientific Instruments

Volumn 70, Issue 7, 1999, Pages 3077-3082

  Russev, Stoyan C ^a   Arguirov, Tzanimir Vl ^a  

^a UNIVERSITY OF SOFIA   (Bulgaria)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001595643     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1149870     Document Type: Article

References (17)

1. R. M. A. Azzam and N. M. Bashara, Ellipsometry and Polarized Light (North-Holland, Amsterdam, 1977).
2. P. S. Hauge, Surf. Sci. 96, 108 (1980).
3. P. S. Houge and F. H. Dill, IBM J. Res. Dev. 38, 472 (1973).
4. D. E. Aspnes and A. A. Studna, Appl. Opt. 14, 220 (1975).
5. R. W. Collins, Rev. Sci. Instrum. 61, 2029 (1990).
6. G. Zalczer, Rev. Sci. Instrum. 59, 2620 (1988).
7. S. Russev, Appl. Opt. 28, 1504 (1989).
8. R. W. Stobie, B. Rao, and M. J. Dignam, Appl. Opt. 14, 999 (1975).
9. R. W. Stobie, B. Rao, and M. J. Dignam, J. Opt. Soc. Am. 65, 25 (1975).
10. K.-L. Barth and F. Keilmann, Rev. Sci. Instrum. 64, 870 (1992).
11. P. Horowitz and W. Hill, The Art of Electronics, 2nd ed. (Cambridge University Press, Cambridge, 1989).
12. D. Aspnes, Opt. Commun. 8, 222 (1973).
13. S. Russev and B. Petkov, J. Opt. 21, 277 (1990).
14. L. Schrottke and G. Jungk, Rev. Sci. Instrum. 65, 3657 (1994).
15. W. S. Dorn and D. D. McCracken, Numerical Methods with Fortran IV Case Studies (Wiley, New York, 1972).
16. D. E. Aspnes, Appl. Opt. 14, 1131 (1975).
17. S. Russev, L. Vassilev, V. Vulchev, L. Lutov, and T. Argirov, J. Phys.: Condens. Matter 6, 6237 (1994).