Probe calibration in magnetic force microscopy

Applied Physics Letters

Volumn 57, Issue 24, 1990, Pages 2612-2614

  Goddenhenrich T ^a   Lemke, H ^a   Muck M ^a   Hartmann, U ^a   Heiden, C ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

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EID: 0001594294     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.103827     Document Type: Article

References (15)