Stabilization and calibration of x-ray wavelengths for anomalous diffraction measurements using synchrotron radiation

Review of Scientific Instruments

Volumn 67, Issue 10, 1996, Pages 3428-3433

  Evans, G ^a,b   Pettifer, R F ^b  

^a DESY   (Germany)

^b UNIVERSITY OF WARWICK   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001588547     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147155     Document Type: Article

References (11)

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4. R. James, The Optical Principles of the Diffraction of X-rays (Bell, London, 1969).
5. R. F. Pettifer and C. Hermes, J. Appl. Crystallogr. 18, 404 (1985).
6. G. Evans and K. S. Wilson (unpublished).
7. G. Evans, Ph.D. thesis, Dept. of Physics, University of Warwick (1994).
8. J. Hoyt, D. de Fontaine, and W. Warburton, J. Appl. Crystallogr. 17, 344 (1984).
9. Z. Otwinowsky, in Isomorphous Replacement and Anomalous Scattering, Proceedings of the CCP4 Study Weekend. SERC/CCP4, edited by W. Wolf, P. Evans, and A. Leslie (SERC, Daresbury Laboratory, Daresbury, 1991), pp. 80-86.
10. W. I. Weis, R. Kahn, R. Foume, K. Drickamer, and W. A. Hendrickson, Science 254, 1608 (1991).
11. D. Cromer and D. Libermann, J. Chem. Phys. 53, 1891 (1970).