Scaling relationship between effective critical exponents throughout the crossover region in thin Ising films

European Physical Journal B

Volumn 14, Issue 2, 2000, Pages 317-321

  Marques M I ^a   Gonzalo, J A ^a  

^a UNIVERSIDAD AUTÓNOMA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001587869     PISSN: 14346028     EISSN: None     Source Type: Journal    
DOI: 10.1007/s100510050135     Document Type: Article

References (23)

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