-
1
-
-
0042305810
-
-
Alyea, E. C., Ferguson, G., Malito, J. & Ruhl, B. L. (1985). Inorg. Chem. 24, 3719-3720.
-
(1985)
Inorg. Chem.
, vol.24
, pp. 3719-3720
-
-
Alyea, E.C.1
Ferguson, G.2
Malito, J.3
Ruhl, B.L.4
-
2
-
-
0000574393
-
-
Barron, P. F., Dyason, J. C., Engelhardt, L. M., Healy, P. C. & White, A. H. (1984). Inorg. Chem. 23, 3766-3769.
-
(1984)
Inorg. Chem.
, vol.23
, pp. 3766-3769
-
-
Barron, P.F.1
Dyason, J.C.2
Engelhardt, L.M.3
Healy, P.C.4
White, A.H.5
-
5
-
-
0000591792
-
-
Churchill, M. R., DeBoer, B. G. & Donovan, D. J. (1975). Inorg. Chem. 14, 617-623.
-
(1975)
Inorg. Chem.
, vol.14
, pp. 617-623
-
-
Churchill, M.R.1
DeBoer, B.G.2
Donovan, D.J.3
-
6
-
-
0001180324
-
-
Churchill, M. R., DeBoer, B. G. & Mendak, S. J. (1975). Inorg. Chem. 14, 2041-2047.
-
(1975)
Inorg. Chem.
, vol.14
, pp. 2041-2047
-
-
Churchill, M.R.1
DeBoer, B.G.2
Mendak, S.J.3
-
7
-
-
0000731187
-
-
Churchill, M. R., Donahue, J. & Rotella, F. J. (1976). Inorg. Chem. 15, 2752-2758.
-
(1976)
Inorg. Chem.
, vol.15
, pp. 2752-2758
-
-
Churchill, M.R.1
Donahue, J.2
Rotella, F.J.3
-
12
-
-
37049106572
-
-
Dyason, J. C., Healy, P. C., Engelhardt, L. M., Pakawatchai, C., Patrick, V. A., Raston, C. L. & White, A. H. (1985). J. Chem. Soc. Dalton Trans. pp. 831-838.
-
(1985)
J. Chem. Soc. Dalton Trans.
, pp. 831-838
-
-
Dyason, J.C.1
Healy, P.C.2
Engelhardt, L.M.3
Pakawatchai, C.4
Patrick, V.A.5
Raston, C.L.6
White, A.H.7
-
15
-
-
0031551679
-
-
Pike, R. D., Starnes, W. H. Jr, Jeng, J. P., Bryant, W. S., Kourtesis, P., Adams, C. W., Bunge, S. D., Kang, Y. M., Kim, A. S., Kim, J. H., Macko, J. A. & O'Brien, C. P. (1997). Macromolecules, 30, 6957-6965.
-
(1997)
Macromolecules
, vol.30
, pp. 6957-6965
-
-
Pike, R.D.1
Starnes Jr., W.H.2
Jeng, J.P.3
Bryant, W.S.4
Kourtesis, P.5
Adams, C.W.6
Bunge, S.D.7
Kang, Y.M.8
Kim, A.S.9
Kim, J.H.10
Macko, J.A.11
O'Brien, C.P.12
-
16
-
-
84943883341
-
-
Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA
-
Sheldrick, G. M. (1990). SHELXTL/PC. An Integrated System for Data Collection, Processing, Structure Solution and Refinement. Siemens Analytical X-ray Instruments Inc., Madison, Wisconsin, USA.
-
(1990)
SHELXTL/PC. An Integrated System for Data Collection, Processing, Structure Solution and Refinement
-
-
Sheldrick, G.M.1
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