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Volumn 214, Issue 4, 1999, Pages 503-504

Crystal structure of bromo-(1,10-phenathroline-N,N′)(triphenylphosphine) silver(I) dihydrate, Ag(Phen)(PPh3)Br · 2H2O

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001579530     PISSN: 14337266     EISSN: None     Source Type: Journal    
DOI: 10.1515/ncrs-1999-0452     Document Type: Article
Times cited : (5)

References (7)
  • 1
    • 0001646722 scopus 로고    scopus 로고
    • 4-bis(quinoline)-1κN,2κN-bis(triphenylphosphine)- 1κP,2κP-dicopper(I)
    • 4-bis(quinoline)-1κN,2κN-bis(triphenylphosphine)- 1κP,2κP-dicopper(I). Acta Crystallogr. C54 (1998) 948-949.
    • (1998) Acta Crystallogr. , vol.C54 , pp. 948-949
    • Jin, Q.H.1    Long, D.L.2    Wang, Y.X.3    Xin, X.Q.4
  • 2
    • 0000350530 scopus 로고    scopus 로고
    • 4Br-bis(quinoline)-1κN,2κN-bis(triphenylphosphine)- 1κP,2κP-dicopper(I)
    • 4Br-bis(quinoline)-1κN,2κN-bis(triphenylphosphine)- 1κP,2κP-dicopper(I). Acta Crystallogr. C55 (1999) 341-343.
    • (1999) Acta Crystallogr. , vol.C55 , pp. 341-343
    • Jin, Q.H.1    Wang, Y.X.2    Xin, X.L.3
  • 3
    • 0000520129 scopus 로고    scopus 로고
    • Iodo (1,10-Phenanthroline-N,N′) (Triphenylphosphine) Copper(I)
    • Jin, Q. H.; Xin, X. L.; Dong, C. J.; Zhu, H. J.: Iodo (1,10-Phenanthroline-N,N′) (Triphenylphosphine) Copper(I). Acta Crystallogr. C54 (1998) 1087-1089.
    • (1998) Acta Crystallogr. , vol.C54 , pp. 1087-1089
    • Jin, Q.H.1    Xin, X.L.2    Dong, C.J.3    Zhu, H.J.4
  • 4
    • 84943920736 scopus 로고
    • Phase Annealing in SHELX-90: Direct Methods for Larger Structures
    • Sheldrick, G. M.: Phase Annealing in SHELX-90: Direct Methods for Larger Structures. Acta Crystallogr. A46 (1990) 467-473.
    • (1990) Acta Crystallogr. , vol.A46 , pp. 467-473
    • Sheldrick, G.M.1
  • 6
    • 33749627180 scopus 로고
    • Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin, USA
    • Siemens: XP. Molecular Graphics. Version 5.03. Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin, USA 1994.
    • (1994) XP. Molecular Graphics. Version 5.03
  • 7
    • 0003428070 scopus 로고
    • Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin, USA
    • Siemens: XEMP. Empirical Absorption Correction Program. Siemens Analytical X-ray Instrument Inc., Madison, Wisconsin, USA 1991.
    • (1991) XEMP. Empirical Absorption Correction Program


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.