An interpretation of the Auger LVV transitions from oxides of third-row elements

Journal of Electron Spectroscopy and Related Phenomena

Volumn 12, Issue 4, 1977, Pages 375-393

  Bernett, Marianne K ^a   Murday, James S ^a   Turner, Noel H ^a  

^a NAVAL RESEARCH LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001576688     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(77)85089-5     Document Type: Article

References (41)

1. Influence of doping on the electron spectrum of silicon
2. Interatomic Auger processes and the density of states
3. On the bonding of the ions PO43-, SO42-, ClO4-, ClO3-and CO32-as studied by X-ray spectroscopy andab initioSCF-MO calculations
4. The X-Ray Emission Spectra of the Compounds of Third-period Elements. VI. The Relationship between the Kα and Kβ Spectra
5. Auger Line Shape Comparison of N and S in Two Different Chemical Environments
6. Reevaluation of X-Ray Atomic Energy Levels
7. An X-Ray Emission Spectroscopic Investigation of the Chemical Bond of Sulfur. III. The Profile of SKβ Band in Sulfur Compounds
8. The X-Ray Emission Spectra of the Compounds of Third-period Elements. II. The K Spectra of Phosphorus in Compounds
9. The Detection of Silicon-Oxynitride Layers on the Surfaces of Silicon-Nitride Films by Auger Electron Emission
10. Low Energy Auger Emission from Lithium Fluoride