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Volumn 88-91, Issue , 1998, Pages 725-732

Characterization of LiF and CaF2 surfaces using MIES and UPS (HeI)

Author keywords

ab initio electronic structure calculations; CaF2; ESD; LiF; Metastable impact electron spectroscopy (MIES); PSD; UPS

Indexed keywords


EID: 0001575880     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0368-2048(97)00216-8     Document Type: Article
Times cited : (19)

References (40)
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  • 20
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  • 21
    • 0026954744 scopus 로고
    • P.A. Zeijlmans van Emmichhoven, P.A.A.F. Wouters, A. Niehaus, Surf. Sci. 195 (1988) 115; P. Eeken, J.M. Fluit, A. Niehaus, I. Urazgildin, Surf. Sci. 273 (1992) 160; H. Brenten, H. Müller, A. Niehaus, V. Kempter, Surf. Sci. 278 (1992) 183.
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    • M. Causa, R. Dovesi, F. Ricca, Surf. Sci. 280 (1993) 1; A. Pavese, R. Dovesi, C. Roetti, M. Causa, Phys. Rev. B44 (1991) 3509; M. Causa, R. Dovesi, C. Pisani, C. Roetti, Phys. Rev. B33 (1986) 1308.
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    • in preparation, not published yet
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    • ISSN 0255-5476 Trans Tech Publications
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    • (1996) Defects in Insulating Materials , pp. 699


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.