Patents, R&D, and technological spillovers at the firm level: Some evidence from econometric count models for panel data

Journal of Applied Econometrics

Volumn 12, Issue 3, 1997, Pages 265-280

  Cincera, Michele ^a  

^a UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001555117     PISSN: 08837252     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-1255(199705)12:3<265::AID-JAE439>3.0.CO;2-J     Document Type: Article

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