Understanding hot-electron transport in silicon devices: Is there a shortcut?

Journal of Applied Physics

Volumn 78, Issue 2, 1995, Pages 1058-1087

  Fischetti, M V ^a   Laux, S E ^a   Crabbe E ^b  

^a IBM T J WATSON RESEARCH CENTER   (United States)

^b IBM RESEARCH   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001553399     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.360340     Document Type: Article

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