SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Physical Review B

Volumn 39, Issue 18, 1989, Pages 13053-13060

Symmetry breaking in nitrogen-doped amorphous carbon: Infrared observation of the Raman-active G and D bands

(3) Kaufman, J H a Metin, S a Saperstein, D D b

a IBM ALMADEN RESEARCH CENTER (United States)

b IBM (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001548543 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.39.13053 Document Type: Article

Times cited : (767)

References (33)

1
- 0010340384
- (1987) Wear , vol.116 , pp. 379
- Seki, H.¹ McClelland, G.M.² Bullock, D.C.³

2
- 84947669494
- Characterization of diamondlike carbon films and their application as overcoats on thin-film media for magnetic recording
- (1987) Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films , vol.5 , pp. 3287
- Tsai, H.¹ Bogy, D.B.²

3
- 84953675069
- Structure and properties of sputtered carbon overcoats on rigid magnetic media disks
- (1988) Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films , vol.6 , pp. 2307
- Tsai, H.¹ Bogey, D.B.² Kundmann, M.R.³ Veirs, D.K.⁴ Hilton, M.R.⁵ Mayer, S.T.⁶

4
- 0015080715
- (1971) J. Appl. Phys. , vol.42 , pp. 2953
- Aisenberg, S.¹ Chabot, R.²

5
- 21544462086
- (1985) J. Appl. Phys. , vol.58 , pp. 518
- Savvides, N.¹

6
- 0020831908
- (1983) Philos. Mag. B , vol.48 , pp. 341
- McKenzie, D.R.¹ McPhedran, R.² Savvides, N.³ Botten, L.C.⁴

7
- 0009661538
- (1988) Science , vol.241 , pp. 913
- Angus, J.C.¹ Hayman, C.C.²

8
- 49049146107
- (1981) Thin Solid Films , vol.80 , pp. 227
- Enke, K.¹

9
- 84926828818
- H. Seki, International Conference on Metallurgical Coatings, San Diego, 1988 (in press).

10
- 0014829099
- Raman Spectrum of Graphite
- (1970) The Journal of Chemical Physics , vol.53 , pp. 1126
- Tuinstra, F.¹ Koenig, J.L.²

11
- 0017923107
- (1978) J. Am. Ceram. Soc. , vol.61 , pp. 13
- Vidano, R.¹ Fischbach, D.B.²

12
- 33645143382
- (1984) Phys. Rev. B , vol.29 , pp. 3482
- Dillon, R.O.¹ Woollam, J.A.² Katkanant, V.³

13
- 0000414197
- (1988) J. Appl. Phys. , vol.64 , pp. 3031
- Parmigiani, F.¹ Kay, E.² Seki, H.³

14
- 84926873824
- (private communication).
- Foster, J.¹ Frommer, J.²

15
- 0023983419
- (1988) Solid State Commun. , vol.65 , pp. 921
- Han, H.-X.¹ Feldman, B.J.²

16
- 0020208072
- (1982) Philos Mag. B , vol.46 , pp. 423
- Jones, D.J.¹ Stewart, A.D.²

17
- 0342379997
- edited by, J. W. Coburn, R. A. Gottscho, D. W. Hess, Materials Research Society, Pittsburgh
- (1986) Plasma Processing , pp. 175
- Voke, N.¹ Kanicki, J.²

18
- 0001654021
- (1984) Icarus , vol.60 , pp. 127
- Khare, B.N.¹ Sagan, C.² Arakawa, E.³ Suits, F.⁴ Alcott, T.A.⁵ Williams, M.W.⁶

19
- 0004957576
- (1970) J. Phys. Chem. , vol.74 , pp. 2921
- Friedel, R.A.¹ Hofer, L.J.E.²

20
- 3643064461
- (1966) J. Chem. Phys. , vol.44 , pp. 310
- Greenler, R.G.¹

21
- 0018334573
- (1980) Physica , vol.99 B , pp. 443
- Solin, S.A.¹

22
- 4243566030
- (1985) Phys. Rev. B , vol.31 , pp. 6669
- Conrad, M.P.¹ Strauss, H.L.²

23
- 0009264386
- (1988) Appl. Phys. Lett. , vol.52 , pp. 1639
- Yoshikawa, M.¹ Katagiri, G.² Ishida, H.³ Ishitani, H.⁴ Akamatsu, T.⁵

24
- 4243363393
- (1984) Phys. Rev. B , vol.30 , pp. 870
- Beeman, D.¹ Silverman, J.² Lynds, R.³ Anderson, M.R.⁴

25
- 0023040419
- (1986) J. Non-Cryst. Solids , vol.88 , pp. 131
- Richter, A.¹ Scheibe, H.-J.² Pompe, W.³ Brzezinka, K.-W.⁴ Muhling, I.⁵

26
- 0003444323
- Academic, New York
- (1975) Introduction to Infrared and Raman Spectroscopy, 2nd ed.
- Colthup, N.B.¹ Daly, L.H.² Wiberley, S.E.³

27
- 0001230598
- (1972) Fuel , vol.51 , pp. 194
- Friedel, R.A.¹ Carlsen, G.L.²

28
- 0000594855
- (1988) J. Am. Chem. Soc. , vol.110 , pp. 1337
- Wentrup, C.¹

29
- 0004050117
- Academic, New York
- (1971) Infrared Spectra of Labelled Compounds , pp. 216
- Pinchas, S.¹ Laulicht, I.²

30
- 84926810565
- (1987) Adv. Phys. , vol.25 , pp. 317
- Robertson, J.¹

31
- 84926828817
- The four-point probe is, of course, designed to be insensitive to contact resistance. However, if the contact resistance is sufficiently high, the outer probes will not supply sufficient current for an accurate voltage reading. This can occur even if the intrinsic resistivity is less than 106 Ω ^ cm.

32
- 0019558533
- (1981) Appl. Opt. , vol.20 , pp. 1333
- Jackson, W.B.¹ Amer, N.M.² Boccara, A.C.³ Fournier, D.⁴

33
- 0021563373
- edited by, J. I. Pankove, Academic, New York
- (1984) Semiconductors and Semimetals , vol.21 Part B , pp. 83
- Amer, N.M.¹ Jackson, W.B.²

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.