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Journal of Applied Physics

Volumn 74, Issue 11, 1993, Pages 6655-6666

Field-effect conductance in amorphous silicon thin-film transistors with a defect pool density of states

(2) Deane, S C a Powell, M J a

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001533367 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.355108 Document Type: Article

Times cited : (39)

References (27)

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