X-ray sensitivity of a-Se for x-ray imaging with electrostatic readout

Journal of Applied Physics

Volumn 83, Issue 6, 1998, Pages 2879-2887

  Kasap, S O ^a   Aiyah, V ^a   Polischuk, B ^a   Baillie, A ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001527990     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367074     Document Type: Article

References (45)

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