Atomic force microscope study of growth kinetics: Scaling in the heteroepitaxy of CuCl on CaF2(111)

Physical Review Letters

Volumn 72, Issue 21, 1994, Pages 3374-3377

  Tong, William M ^a,b,c   Williams, R Stanley ^a,b,c   Yanase, Akihisa ^a,b,c   Segawa, Yusaburo ^a,b,c   Anderson, Mark S ^a,b,c  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b RIKEN   (Japan)

^c CALIFORNIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001514185     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.72.3374     Document Type: Article

References (21)

1. Phänomenologische Theorie der Kristallabscheidung an Oberflächen. I
2. One-Dimensional Dislocations. I. Static Theory
3. Nucleation and growth processes in thin film formation
4. Growth and luminescence spectroscopy of a CuCl quantum well structure