Electrochromism in MoOx films characterized by X-ray electron spectroscopy

Journal of Electron Spectroscopy and Related Phenomena

Volumn 101-103, Issue , 1999, Pages 397-400

  Souza Cruz, Tersio G ^a   Gorenstein, A ^a   Landers, Richard ^a   Kleiman, George G ^a   DeCastro, Sandra C ^a  

^a UNIVERSITY OF CAMPINAS   (Brazil)

Author keywords

Electrochromism; Molybdenum oxide films

Indexed keywords

EID: 0001509921     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0368-2048(98)00401-0     Document Type: Article

References (18)

1. T.H. Fleisch, G.J. Mains, J. Chem. Phys. 76 (1982) 780.
2. C.G. Granqvist, Handbook of Inorganic Electrochromic Materials, Elsevier Science, Netherlands, 1995.
3. O. Zelaya-Angel, C. Menezes, F. Sanchez-Sinencio, F.F.L. Ferreira, J. Appl. Phys. 51 (1980) 6022.
4. C. Julien, A. Khelfa, J.P. Guesdon, A. Gorenstein, Appl. Phys. A59 (1994) 173.
5. J.N. Yao, B.H. Loo, K. Hashimoto, A. Fujishima, J. Eletroanal. Chem. 290 (1990) 263.
6. K. Hinokuma, K. Ogasawara, A. Kishimoto, S. Takano, T. Kudo, Solid State Ionics 53-56 (1992) 507.
7. P. F Garcia, E.M. McCarron, Thin Solid Films 155 (1987) 53.
8. A. Gorenstein, J. Lourenço, J. Scarminio, J. Electrochem. Soc. 143 (1996) 2822.
9. J.A. Dobrowolski, in: Handbook of Optics, McGraw-Hill Book Company, New York, 1978.
10. Y. Hiruta, M. Kitao, S. Yamada, Jpn. J. Appl. Physics 23 (1984) 1624.
11. A. Guerfi, R.W. Paynter, H. Lê Dao, J. Electrochem. Soc. 142 (1995) 3457.
12. T. Maruyama, T. Kanagawa, J. Electrochem. Soc. 142 (1995) 1644.
13. V.K. Sabhapathi, O.M.D. Hussain, P.S. Reddy, K.T. Ramakrisna Reddy, S. Uthanna, B.S. Naidu, P. Jayarama Redy, Phys. Stat. Sol. (a) 148 (1993) 167.
14. M. Anwar, C.A. Hogarth, Phys. Stat. Sol. (a) 109 (1998) 469.
15. J. Tauc, in: F. Abeles (Ed.), The Optical Properties of Solids, North Holland, Amsterdam, 1972.
16. P.F. Garcia, E. McCarron III, Thin Solid Films 155 (1987) 53.
17. M. Anwar, C.A. Hogarth, R. Bulpett, J. Mater. Sci. 24 (1989) 3087.
18. R.J. Colton, A.M. Guzman, J.W. Rabalais, J. Appl. Phys. 49 (1978) 409.