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Volumn 79, Issue 10, 1996, Pages 7555-7562

Swift-heavy-ion induced damage in germanium: An evaluation of defect introduction rates

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001506058     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.362411     Document Type: Review
Times cited : (24)

References (35)
  • 30
    • 85033000542 scopus 로고    scopus 로고
    • P. Blood and J. W. Orton, in Ref. 30, p. 108
    • P. Blood and J. W. Orton, in Ref. 30, p. 108.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.