Photo-Enhanced Native Oxidation Process for Hg0.8Cd0.2Te Photoconductors

IEEE Journal of Quantum Electronics

Volumn 36, Issue 5, 2000, Pages 583-589

  Chang, S J ^a,d,e,f   Su, Y K ^a,e,g   Juang, F S ^b   Lin, C T ^a   Chiang, Chang Der ^c,h   Cherng, Ya Tung ^c,i,j  

^a NATIONAL CHENG KUNG UNIVERSITY   (Taiwan)

^b NATIONAL FORMOSA UNIVERSITY   (Taiwan)

^c CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY   (Taiwan)

^d STONY BROOK UNIVERSITY   (United States)

^e UNIVERSITY OF CALIFORNIA   (United States)

^f Kashino Diverse Brain Research Laboratory of NTT Communication Science Laboratories   (Japan)

^g BINGHAMTON UNIVERSITY   (United States)

^h NATIONAL TSING HUA UNIVERSITY   (Taiwan)

ⁱ SYRACUSE UNIVERSITY   (United States)

^j UNIVERSITY OF UTAH   (United States)

more..

Author keywords

CVD; Mercury compounds; Noise measurement; Oxidation; Passivation; Photoconducting devices; Photodetectors

Indexed keywords

EID: 0001505858     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/3.842100     Document Type: Article

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