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Volumn 81, Issue C, 1991, Pages 177-209

Design Principles of an Optimized Focused Ion Beam System

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001498593     PISSN: 00652539     EISSN: None     Source Type: Book Series    
DOI: 10.1016/S0065-2539(08)60865-3     Document Type: Article
Times cited : (25)

References (49)
  • 13
    • 85023558714 scopus 로고
    • AFOSR/AFSC Final Technical Report, DTIC Document AD-A149–992
    • R. Levi-Setti, [1984], AFOSR/AFSC Final Technical Report, DTIC Document AD-A149–992.
    • (1984)
    • Levi-Setti, R.1
  • 16
    • 0020815723 scopus 로고
    • Liebel, H., Vacuum, 33, 1983, 525.
    • (1983) Vacuum , vol.33 , pp. 525
    • Liebel, H.1
  • 17
    • 85023449895 scopus 로고
    • O. Johari SEM Inc., AMF O'Hare Chicago, Illinois
    • Liebel, H., Johari, O., (eds.) Scanning Electron Microscopy II, 1985, SEM Inc., AMF O'Hare, Chicago, Illinois, 519.
    • (1985) Scanning Electron Microscopy II , pp. 519
    • Liebel, H.1
  • 46
    • 85023576847 scopus 로고
    • Ximen, J., Optik, 80, 1988, 2.
    • (1988) Optik , vol.80 , pp. 2
    • Ximen, J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.