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Volumn 68, Issue 2, 1996, Pages 238-240

Influence of ion bombardment on Si and SiGe films during molecular beam epitaxy growth

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0001498313     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116472     Document Type: Article
Times cited : (16)

References (14)
  • 1
    • 21544468941 scopus 로고    scopus 로고
    • For a review, see example, H. A. Atwater, Diffusion and Defect Data, Part B 27, 67 (1992).
    • For a review, see example, H. A. Atwater, Diffusion and Defect Data, Part B 27, 67 (1992).
  • 14
    • 21544469511 scopus 로고    scopus 로고
    • W. M. Chen, I. A. Buyanova, A. Henry, W.-X. Ni, G. V. Hansson, and B. Monemar, Proceedings of the Materials Research Society, 1995 (in press).
    • W. M. Chen, I. A. Buyanova, A. Henry, W.-X. Ni, G. V. Hansson, and B. Monemar, Proceedings of the Materials Research Society, 1995 (in press).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.