Extraordinary crystallization of amorphous Si/SiO2 superlattices

Journal of Non-Crystalline Solids

Volumn 266-269 A, Issue , 2000, Pages 640-644

  Zacharias, M ^a   Blasing J ^a   Hirschman, K ^b   Tsybeskov, L ^b   Fauchet, P M ^b  

^a OTTO VON GUERICKE UNIVERSITY   (Germany)

^b University of Rochester   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001495605     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/s0022-3093(00)00033-8     Document Type: Article

References (10)

1. G.V.M. Willams, A. Bittar, H.J. Trodahl, J. Appl. Phys. 67 (1990) 1874.
2. L. Tsybeskov, K.D. Hirschman, S.P. Duttagupta, M. Zacharias, P.M. Fauchet, J. McCaffrey, D.J. Lockwood, Appl. Phys. Lett. 72 (1998) 43.
3. P.D. Persans, A. Ruppert, B. Abeles, J. Non-Cryst. Solids 102 (1988) 130.
4. M. Zacharias, Adv. Solid State Phys. 39 (1999) 131.
5. J. Bläsing, P. Kohlert, J. Bäsing, M. Zacharias, J. Appl. Cryst. 31 (1998) 589.
6. H.P. Klug, L.E. Alexander, X-ray Diffraction Procedures, Wiley, New York, 1974.
7. M. Zacharias, J. Bläsing, P. Veit, L. Tsybeskov, K.D. Hirschman, P.M. Fauchet, Appl. Phys. Lett. 74 (1999) 2614.
8. M. Zacharias, L. Tsybeskov, K.D. Hirschman, P.M. Fauchet, J. Bläsing, P. Kohlert, P. Veit, J. Non-Cryst. Solids 227-230 (1997) 1136.
9. G. Bauer, W. Richter, Optical Characterization of Epitaxial Semiconductor Layers, Springer, Berlin, 1996, p. 310.
10. M. Hamasaki, T. Adachi, S. Wakayama, M. Kikuchi, J. Appl. Phys. 49 (1978) 3987.