Automatic visual/IR image registration

Optical Engineering

Volumn 35, Issue 2, 1996, Pages 391-400

  Li, Hui Henry ^b,c,d,e   Zhou, Yi Tong ^a,b,f,g  

^a SPIE ^*

^b HNC Software Inc   (United States)

^c FUDAN UNIVERSITY   (China)

^d UNIVERSITY OF CALIFORNIA   (United States)

^e Rockwell International   (United States)

^f EAST CHINA NORMAL UNIVERSITY   (China)

^g UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

Consistency cheking; Contour extraction; Image registration; Multisensor analysis; Point feature extraction; Wavelet transforms

Indexed keywords

EID: 0001492041     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.600908     Document Type: Article

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