Recent advances in the development of a multiwavelength imaging pyrometer

Optical Engineering

Volumn 36, Issue 11, 1997, Pages 3176-3187

  Kaplinsky, Michael B ^a,c,j   Li, Jun ^a,d,e   McCaffrey, Nathanial J ^a,b   Patel, Vipulkumar ^a,b   Hou, Edwin S H ^a,f,g,h,i   Ravindra, Nuggehalli M ^a   Manikopoulos, Constantine N ^a   Kosonocky, Walter F ^a  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b SARNOFF CORPORATION   (United States)

^c Photobit Inc   (United States)

^d TSINGHUA UNIVERSITY   (China)

^e Exar Corporation   (United States)

^f UNIVERSITY OF MICHIGAN   (United States)

^g STANFORD UNIVERSITY   (United States)

^h PURDUE UNIVERSITY   (United States)

ⁱ Sarnoff Corporation ^*

^j International Society for Optics and Photonics   (United States)

more..

Author keywords

Emissivity; Infrared image sensor; Multispectral radiometry; Radiometric temperature measurement

Indexed keywords

EID: 0001487018     PISSN: 00913286     EISSN: None     Source Type: Journal    
DOI: 10.1117/1.601556     Document Type: Article

References (14)

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