Analysis of dark-line defect growth suppression in InxGa1-xAs/GaAs strained heterostructures

Journal of Applied Physics

Volumn 81, Issue 7, 1997, Pages 3117-3123

  Wang, H ^a   Hopgood, A A ^b   Ng, G I ^a  

^a NANYANG TECHNOLOGICAL UNIVERSITY   (Singapore)

^b OPEN UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001479772     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.364353     Document Type: Article

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