-
2
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-
84926902655
-
-
For reviews see, for example, K. Fischer, in Springer Tracts in Modern Physics, edited by G. Höhler (Springer Verlag, Berlin, 1970), Vol. 54, p. 1; M. Daybell, in Magnetism, edited by G. T. Rado and H. Suhl (Academic Press, New York, 1973), Vol. 5.
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28
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84926883958
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M. A. Blachly, Ph.D. thesis, Purdue University, 1994.
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-
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30
-
-
84926883957
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-
The Au(Fe 7
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-
-
-
35
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-
84926916380
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-
More careful modeling of the effect of such a presumed depth dependent oxidation leads to predictions for Δ ρ K as a function of t which are quantitatively and qualitatively different from the experiments [N. Giordano (unpublished)].
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-
-
-
37
-
-
84926902654
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-
The residual resistance ratio of the wires was the same as that of the films from which they were fabricated, indicating that the two had the same resistivities. The film resistivity could then be used, along with the wire length and resistance, to calculate the wire's cross sectional area.
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-
-
-
39
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-
84926935259
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-
Different authors have reported slightly different values of TK for Cu(Fe). The differences seem to be due to the use of different (approximate) theoretical expressions for Δ ρ K (T). In any case, all of the values lie in the range 10 30 K, and for convenience we will take 20 K to be the Kondo temperature for Cu(Fe).
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-
-
-
44
-
-
84926916379
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-
When the pure layers were deposited, we deposited them in different random order from batch to batch. That is, we did not simply deposit the thinnest one first, the next thinnest layer next, etc., ending with the thickest layer. Rather, the order was chosen randomly. We also performed tests in which two pure layers of the same thickness were deposited first and last in the sequence. These samples always exhibited identical behavior.
-
-
-
-
46
-
-
84926883956
-
-
While, as can be seen from Fig. 8, there was significant scatter of the results among different samples, we wish to emphasize that for a given batch E was always larger for the sample with less disorder in the Cu layer.
-
-
-
-
49
-
-
0004879786
-
-
The picture we have in mind is similar, at least in spirit, to the ideas discussed in Y. Meir and N. Wingreen [, ]. However, their calculations are intended to apply to a case somewhat different from ours.
-
(1994)
Phys. Rev. B
, vol.50
, pp. 4947
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-
-
53
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-
84926935258
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-
For reviews see, for example, K. Fischer in Springer Tracts in Modern Physics , Vol. 54, edited by G. Höhler (Springer Verlag, Berlin, 1970), p. 1; M. Daybell in Magnetism, Vol. 5, edited by G. T. Rado and H. Suhl (Academic Press, New York, 1973)
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-
-
-
56
-
-
84926883955
-
-
ibid. 1004.
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-
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58
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-
84926916378
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-
A. C. Hewson, The Kondo Problem to Heavy Fermions, Cambridge University Press, 1993.
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-
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63
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84926883954
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-
See, for example C. P. Slichter, in, edited by, J. J. Becker, G. H. Lander, J. J. Rhyne, (1976), p.
-
Magnetism and Magnetic Materials 1975, AIP Conf. Proc. #29
, pp. 306
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79
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-
84926883953
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-
M. A. Blachly, Ph. D. thesis, Purdue University (1994).
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-
-
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80
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-
84926902653
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-
C. Van Haesendonck, private communication.
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-
-
-
81
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84926916377
-
-
The Au(Fe 7
-
-
-
-
86
-
-
84926883952
-
-
More careful modeling of the effect of such a presumed depth dependent oxidation leads to predictions for Δ ρ K as a function of t which are quantitatively and qualitatively different from the experiments (N. Giordano, unpublished).
-
-
-
-
88
-
-
84926902652
-
-
The residual resistance ratio of the wires was the same as that of the films from which they were fabricated, indicating that the two had the same resistivities. The film resistivity could then be used, along with the wire length and resistance, to calculate the wire's cross sectional area.
-
-
-
-
90
-
-
84926883951
-
-
Different authors have reported slightly different values of TK for Cu(Fe). The differences seem to be due to the use of different (approximate) theoretical expressions for Δ ρ K (T). In any case, all of the values lie in the range 10 30 K, and for convenience we will take 20 K to be the Kondo temperature for Cu(Fe).
-
-
-
-
95
-
-
84926935257
-
-
When the pure layers were deposited, we deposited them in different random order from batch to batch. That it, we did not simply deposit the thinnest one first, the next thinnest layer next, etc., ending with the thickest layer. Rather, the order was chosen randomly. We also performed tests in which two pure layers of the same thickness were deposited first and last in the sequence. These samples always exhibited identical behavior.
-
-
-
-
96
-
-
84926916376
-
-
See, for example, Mesoscopic Phenomena in Solids, edited by B. L. Altshuler, P. A. Lee, and R. A. Webb (North Holland, 1991).
-
-
-
-
97
-
-
84926916375
-
-
While, as can be seen from Fig. 8, there was significant scatter of the results among different samples, we wish to emphasize that for a given batch E was always larger for the sample with less disorder in the Cu layer.
-
-
-
-
100
-
-
0004879786
-
-
The picture we have in mind is similar, at least in spirit, to the ideas discussed in Y. Meir and N. Wingreen [, ]. However, their calculations are intended to apply to a case somewhat different from ours.
-
(1994)
Phys. Rev. B
, vol.50
, pp. 4947
-
-
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