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Journal of Applied Physics

Volumn 68, Issue 7, 1990, Pages 3475-3483

Temperature dependence of the electrical characteristics of Yb/p-InP tunnel metal-insulator-semiconductor junctions

(3) Singh, A a Reinhardt, K C b Anderson, W A b

a UNIVERSIDAD DE ORIENTE (Venezuela)

b UNIVERSITY AT BUFFALO (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001452980 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.346358 Document Type: Article

Times cited : (142)

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