DFT-predicted structural, vibrational, and bonding properties of XSiO and X2SiO (X = F, Cl, or Br) molecules

Journal of Computational Chemistry

Volumn 19, Issue 11, 1998, Pages 1205-1214

  Alikhani, M E ^a   Silvi, B ^b  

^a SORBONNE UNIVERSITÉ   (France)

^b LABORATOIRE DE CHIMIE THÉORIQUE   (France)

Author keywords

Bonding analysis; DFT; Electron localization function; IR spectra; Silicon monoxide halides

Indexed keywords

EID: 0001450201     PISSN: 01928651     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-987X(199808)19:11<1205::AID-JCC1>3.0.CO;2-O     Document Type: Article

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