High-accuracy aperture-area measurement facilities at the National Institute of Standards and Technology

Metrologia

Volumn 35, Issue 4, 1998, Pages 497-500

  Fowler, Joel B ^a   Durvasula, R S ^b   Parr, A C ^a  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b TUFTS UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001449863     PISSN: 00261394     EISSN: None     Source Type: Journal    
DOI: 10.1088/0026-1394/35/4/49     Document Type: Article

References (5)

1. Johnson B. Carol, Cromer C. L., Saunders R. D., Eppledauer G., Fowler J., Sapritsky V. I., Dezsi G., Metrologia, 1993, 30, 309-315.
2. Krokotov E., Focusing, Int. J. of Computer Vision, 1987, 1(3), 223-227.
3. Beveridge G., Schechter R., Optimization: Theory and Practice, New York, McGraw-Hill, 1970.
4. Joseph S., Unbiased Least Squares Fitting of Circular Arcs, CVGIP: Graphical Models and Image Processing, 1994, 56(5), 424-432.
5. Fowler J., Dezsi G., J. Res. Natl. Inst. Stand. Technol., 1995, 100, 277.