Measurement of heterojunction band offsets by admittance spectroscopy: InP/Ga0.47In0.53As

Applied Physics Letters

Volumn 50, Issue 12, 1987, Pages 736-738

  Lang, D V ^a   Panish, M B ^a   Capasso, F ^a   Allam, J ^a   Hamm, R A ^a   Sergent, A M ^a   Tsang, W T ^a  

^a LUCENT TECHNOLOGIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001448085     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.98083     Document Type: Article

References (17)