SCOPUS 정보 검색 플랫폼

Volumn 35, Issue 7, 1996, Pages 2005-2011

Projection moiré deflectometry for the automatic measurement of phase objects

Author keywords

Automatic measurement; Deflectometry; Phase objects; Projection moir

Indexed keywords

EID: 0001446415 PISSN: 00913286 EISSN: None Source Type: Journal
DOI: 10.1117/1.600777 Document Type: Article

Times cited : (5)

References (14)

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2
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3
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5
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6
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11
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14
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