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Journal of Applied Physics

Volumn 64, Issue 12, 1988, Pages 6827-6835

Raman determination of layer stresses and strains for heterostructures and its application to the cubic SiC/Si system

(3) Feng, Z C a Choyke, W J a,b Powell, J A c

a UNIVERSITY OF PITTSBURGH (United States)

b Westinghouse Research & Development Cent (United States)

c NASA GLENN RESEARCH CENTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001444035 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.341997 Document Type: Article

Times cited : (100)

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