Time-of-flight secondary-ion-mass spectrometric (ToF-SIMS) and X-ray photoelectron spectroscopic (XPS) analyses of the surface lipids of wool

Journal of the Textile Institute

Volumn 88, Issue 4, 1997, Pages 317-324

  Shao, J ^a   Jones, D C ^a   Mitchell, R ^b   Vickerman, J C ^a   Carr, C M ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

^b CSMA Ltd   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001441710     PISSN: 00405000     EISSN: 17542340     Source Type: Journal    
DOI: 10.1080/00405000.1997.11090886     Document Type: Article

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