Modeling reentrant manufacturing systems with inspection stations

Journal of Manufacturing Systems

Volumn 15, Issue 6, 1996, Pages 367-378

  Narahari, Y ^a   Khan, L M ^a  

^a INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

Inspection and testing; Mean value analysis; Multiclass queuing models; Reentrant lines

Indexed keywords

EID: 0001441631     PISSN: 02786125     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0278-6125(97)83051-8     Document Type: Article

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