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Volumn 45, Issue 4, 1998, Pages 826-833

Dynamic modeling of amorphous- and polycrystalline-silicon devices

Author keywords

[No Author keywords available]

Indexed keywords

COMPLEX ENERGY; ELECTRICAL CHARACTERISTIC; LOCALIZED STATE; NEW EFFICIENT METHOD; NUMERICAL APPROACHES; REALISTIC DEVICES; SEMICONDUCTOR EQUATIONS; THIN-FILM TRANSISTOR (TFTS);

EID: 0001437561     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.662787     Document Type: Article
Times cited : (16)

References (10)
  • 1
    • 0006978668 scopus 로고
    • Model for the above-threshold characteristics and threshold voltage in polycrystalline silicon transistors
    • G. Fortunato and P. Migliorato, "Model for the above-threshold characteristics and threshold voltage in polycrystalline silicon transistors," J. Appl. Phys., vol. 68, no. 5, pp. 2463-2467, 1990.
    • (1990) J. Appl. Phys , vol.68 , Issue.5 , pp. 2463-2467
    • Fortunato, G.1    Migliorato, P.2
  • 3
    • 84920724595 scopus 로고
    • Analysis and characterization of polycrystalline silicon thin-film transistors
    • L. Colalongo et al., "Analysis and characterization of polycrystalline silicon thin-film transistors," in Proc. 1995 ESSDERC Conf., 1995, pp. 75-78.
    • (1995) Proc. 1995 ESSDERC Conf , pp. 75-78
    • Colalongo, L.1
  • 4
    • 0015279206 scopus 로고
    • A new efficient algorithm for solving differential-algebraic systems using implicit backward differentiation formulas
    • Jan
    • R. K. Brayton, F. G. Gustavson, and G. D. Hachtel, "A new efficient algorithm for solving differential-algebraic systems using implicit backward differentiation formulas," Proc. IEEE, vol. 60, pp. 98-108, Jan. 1972.
    • (1972) Proc IEEE , vol.60 , pp. 98-108
    • Brayton, R.K.1    Gustavson, F.G.2    Hachtel, G.D.3
  • 5
    • 0019053947 scopus 로고
    • An alternative implementation of variable step-size multistep formulas for stiff ODE's
    • Sept
    • K. R. Jackson and R. Sacks-Davis, "An alternative implementation of variable step-size multistep formulas for stiff ODE's," ACM Trans. Math. Softw., vol. 6, pp. 295-318, Sept. 1980.
    • (1980) ACM Trans. Math. Softw , vol.6 , pp. 295-318
    • Jackson, K.R.1    Sacks-Davis, R.2
  • 7
    • 0024904912 scopus 로고
    • Delay time studies and electron mobility measurements in an a-Si:H TFT
    • Dec
    • R. Bashir, C. K. Subramanian, G. W. Neudeck, and K. Y. Chung, "Delay time studies and electron mobility measurements in an a-Si:H TFT," IEEE Trans. Electron Devices, vol. 36, pp. 2944-2948, Dec. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2944-2948
    • Bashir, R.1    Subramanian, C.K.2    Neudeck, G.W.3    Chung, K.Y.4
  • 8
    • 0024888643 scopus 로고
    • The physics of amorphous-silicon thin-film transistors
    • Dec
    • M. J. Powell, "The physics of amorphous-silicon thin-film transistors," IEEE Trans. Electron Devices, vol. 36, pp. 2753-2763, Dec. 1989.
    • (1989) IEEE Trans. Electron Devices , vol.36 , pp. 2753-2763
    • Powell, M.J.1
  • 9
    • 0000024499 scopus 로고
    • Amorphous-silicon thin-film transistors: Physics and properties
    • J. Kanicki, ed 2 of Amorphous and Microcrystalline Semiconductor Devices. Norwood, MA: Artech House ch. 8
    • C. van Berkel, "Amorphous-silicon thin-film transistors: Physics and properties," in Materials and Device Physics, J. Kanicki, ed., vol. 2 of Amorphous and Microcrystalline Semiconductor Devices. Norwood, MA: Artech House, 1992, pp. 397-447, ch. 8.
    • (1992) Materials and Device Physics , pp. 397-447
    • Van Berkel, C.1
  • 10
    • 0028463724 scopus 로고
    • An analytical a-Si:H TFT DC/capacitance model using an effective temperature approach for deriving a switching time model for an inverter circuit considering deep and tail states
    • July
    • S.-S. Chen and J. B. Kuo, "An analytical a-Si:H TFT DC/capacitance model using an effective temperature approach for deriving a switching time model for an inverter circuit considering deep and tail states," IEEE Trans. Electron Devices, vol. 41, pp. 1169-1178, July 1994.
    • (1994) IEEE Trans. Electron Devices , vol.41 , pp. 1169-1178
    • Chen, S.-S.1    Kuo, J.B.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.