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Volumn 100, Issue 46, 1996, Pages 18234-18239
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Study of copper sulfide film formation by voltammetry combined with electrochemical quartz crystal microgravimetry/coulometry and optical spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0001415154
PISSN: 00223654
EISSN: None
Source Type: Journal
DOI: 10.1021/jp962125p Document Type: Article |
Times cited : (41)
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References (20)
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