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Volumn 42, Issue 11, 1997, Pages 823-828
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Microfabricated cantilever for AFM/FFM
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Author keywords
Atomic force microscopy; Cantilever; Frictional force microscopy; Probe; Tip material; Torsional behavior
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Indexed keywords
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EID: 0001412240
PISSN: 09151168
EISSN: None
Source Type: Journal
DOI: None Document Type: Article |
Times cited : (2)
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References (5)
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