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Volumn 71, Issue 2 I, 2000, Pages 478-481

Measurement of the complex dielectric constant down to helium temperatures. II. Quasioptical technique from 0.03 to 1 THz

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EID: 0001405940     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1150227     Document Type: Article
Times cited : (26)

References (9)
  • 2
  • 6
    • 4243090865 scopus 로고
    • edited by C. G. Montgomery McGraw-Hill, New York
    • R. M. Redheffer, in Technique of Microwave Measurements, edited by C. G. Montgomery (McGraw-Hill, New York, 1947), pp. 562-596.
    • (1947) Technique of Microwave Measurements , pp. 562-596
    • Redheffer, R.M.1
  • 9
    • 4243175056 scopus 로고    scopus 로고
    • note
    • In our case, the dynamic range varies from 110 dB at 30 GHz to 50 dB at 570 GHz (Ref. 5). Choosing d≤5 δ, measurements with an accuracy of a few percent can be made up to 570 GHz.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.