Inelastic background correction and quantitative surface analysis

Journal of Electron Spectroscopy and Related Phenomena

Volumn 52, Issue C, 1990, Pages 243-271

  Tougaard, S ^a  

^a UNIVERSITY OF SOUTHERN DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001401167     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/0368-2048(90)85022-2     Document Type: Article

References (36)

1. Quantitative analysis of the inelastic background in surface electron spectroscopy
2. Quantitative depth profiling in surface analysis: A review
3. Quantitation of coverages on rough surfaces by XPS: An overview
4. The quantitative analysis of surfaces by XPS: A review
5. X-ray photoelectron spectroscopy peak shape analysis for the extraction of in-depth composition information
6. Concentration depth profiles by XPS; A new approach
7. XPS study of the penetration and reaction speed of polymer derivatization reagents
8. Influence of elastic and inelastic scattering on energy spectra of electrons emitted from solids
9. Deconvolution of loss features from electron spectra
10. Inelastic background removal in x-ray excited photoelectron spectra from homogeneous and inhomogeneous solids
11. Practical algorithm for background subtraction
12. Low energy inelastic electron scattering properties of noble and transition metals
13. Relative intensities in X-ray photoelectron spectra. Part IX. Estimates for photoelectron mean free paths taking into account elastic collisions in a solid
14. Theory of elastic and inelastic scattering of electrons emitted from solids: Energy spectra and depth profiling in XPS/AES
15. Background intensity determination in AES/XPS
16. Direct Monte Carlo simulation of scattering processes of kV electrons in aluminum; comparison of theoretical N(E) spectra with experiment
17. Quantitative electron spectroscopy of surfaces: A standard data base for electron inelastic mean free paths in solids
18. Energy and material dependence of the inelastic mean free path of low-energy electrons in solids
19. Calculations of electron inelastic mean free paths for 31 materials
20. Electron excitation and the optical potential in electron microscopy
21. Inelastic background intensities in XPS spectra
22. Differential inelastic electron scattering cross sections from experimental reflection electron-energy-loss spectra: Application to background removal in electron spectroscopy
23. Test of algorithm for background correction in XPS under variation of XPS peak energy
24. The use of electron loss data as unit impulse response function in deconvolution of electron spectra
25. Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes
26. In-depth concentration profile information through analysis of the entire XPS peak shape
27. Hartree-Slater subshell photoionization cross-sections at 1254 and 1487 eV
28. Relative intensities in photoelectron spectroscopy of atoms and molecules